DocumentCode :
500839
Title :
Beyond verification: Leveraging formal for debugging
Author :
Ranjan, Rajeev K. ; Coelho, Claudionor ; Skalberg, Sebastian
Author_Institution :
Jasper Design Autom., Mountain View, CA, USA
fYear :
2009
fDate :
26-31 July 2009
Firstpage :
648
Lastpage :
651
Abstract :
The latest advancements in the commercial formal model checkers have enabled the integration of formal property verification with the conventional testbench based methods in the overall verification plan. This has led to significant verification productivity across the entire design flow (from architectural verification to post-silicon debugging). As verification productivity is improved, debugging efficiency has become more important than before. In this paper, we discuss how formal technology can be leveraged to bring efficiency in the debugging process. In particular, we discuss how ldquobehavioral indexingrdquo enables a top-down view of the counter-example and facilitates debugging by overlaying a higher abstraction view on the bit-level counter-example. We also discuss how formal technology can be leveraged to do ldquowhat-ifrdquo analysis to localize the root cause of the bug. We also discuss how formal technology supports the even more challenging task of traceless debugging (the process of debugging the ldquoabsence of witness/counter-examplerdquo).
Keywords :
program debugging; program verification; software architecture; architectural verification; behavioral indexing; bit-level counter-example; commercial formal model checkers; post-silicon debugging; testbench based methods; verification plan; verification productivity; Algorithm design and analysis; Automatic testing; Computer bugs; Controllability; Debugging; Design automation; Design engineering; Formal verification; Indexing; Productivity; Formal verification; behavioral indexing; debugging; post-silicon debugging; property verification; traceless debugging;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation Conference, 2009. DAC '09. 46th ACM/IEEE
Conference_Location :
San Francisco, CA
ISSN :
0738-100X
Print_ISBN :
978-1-6055-8497-3
Type :
conf
Filename :
5227096
Link To Document :
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