DocumentCode :
500863
Title :
Finding deterministic solution from underdetermined equation: Large-scale performance modeling by least angle regression
Author :
Li, Xin
Author_Institution :
ECE Dept., Carnegie Mellon Univ., Pittsburgh, PA, USA
fYear :
2009
fDate :
26-31 July 2009
Firstpage :
364
Lastpage :
369
Abstract :
The aggressive scaling of IC technology results in high dimensional, strongly nonlinear performance variability that cannot be efficiently captured by traditional modeling techniques. In this paper, we adapt a novel L1 norm regularization method to address this modeling challenge. Our goal is to solve a large number of (e.g., 104~106) model coefficients from a small set of (e.g., 102~103) sampling points without over-fitting. This is facilitated by exploiting the underlying sparsity of model coefficients. Namely, although numerous basis functions are needed to span the high dimensional, strongly nonlinear variation space, only a few of them play an important role for a given performance of interest. An efficient algorithm of least angle regression (LAR) is applied to automatically select these important basis functions based on a limited number of simulation samples. Several circuit examples designed in a commercial 65 nm process demonstrate that LAR achieves up to 25times speedup compared with the traditional least squares fitting.
Keywords :
integrated circuits; large scale integration; least squares approximations; nonlinear equations; IC technology; L1 norm regularization method; high dimensional performance variability; large-scale performance modeling; least angle regression; least squares fitting; strongly nonlinear performance variability; Circuit simulation; Delay; Equations; Integrated circuit modeling; Large-scale systems; Predictive models; Random variables; Response surface methodology; Sampling methods; Semiconductor device modeling; Process Variation; Response Surface Modeling;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation Conference, 2009. DAC '09. 46th ACM/IEEE
Conference_Location :
San Francisco, CA
ISSN :
0738-100X
Print_ISBN :
978-1-6055-8497-3
Type :
conf
Filename :
5227120
Link To Document :
بازگشت