DocumentCode :
501482
Title :
A novel low-power and high-speed dynamic CMOS logic circuit technique
Author :
Sharroush, Sherif M. ; Abdalla, Yasser S. ; Dessouki, Ahmed A. ; El-Badawy, El-Sayed A.
Author_Institution :
Dept of Elect Eng, Suez Canal Univ., Port Said, Egypt
fYear :
2009
fDate :
17-19 March 2009
Firstpage :
1
Lastpage :
8
Abstract :
Domino CMOS logic finds a wide variety of applications due to their high speed and low device count. In conventional CMOS domino logic, either the dynamic-node capacitor, CL is precharged to VDD during the precharge phase or predischarged to 0 V. The first precharging scheme is more suitable when logic "0" occurrence is more probable at the output due to the large saving in power consumption. On the other hand, the second predischarging scheme is more suitable when logic "1" is more probable at the output. In this paper, we will propose a novel technique to speed up the operation and minimize power consumption when there is an equal probability of occurrence of logic "0" and logic "1". This technique depends on precharging the dynamic node to VDD/2 instead of VDD during the precharge phase. Then, during the evaluation phase, the dynamic-node voltage will be either increased to VDD or decreased to 0 V depending on the state of the inputs. This, of course, saves much of the time and power consumption because discharging the dynamic node from VDD/2 to 0 V is much faster and consumes less power consumption than discharging it from VDD to 0 V. Also, the discharging process and noise margin will be enhanced by virtue of the fact that the time interval during which the keeper combats the discharging process is relatively very small. The proposed technique will be simulated for the 0.13 mum technology with VDD=1.2 V. Simulation results show that about 75% was shaved from the cycle time for the case of "0" and "1" outputs at the expense of an additional silicon area.
Keywords :
CMOS logic circuits; integrated circuit noise; logic design; low-power electronics; Domino CMOS logic; discharging process; high speed dynamic CMOS logic circuit; low power CMOS logic circuit; noise margin; power consumption; CMOS digital integrated circuits; CMOS logic circuits; CMOS memory circuits; Capacitors; Circuit noise; Energy consumption; Irrigation; Logic devices; Silicon; Voltage; dynamic logic; high speed; low power; noise immunity;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Radio Science Conference, 2009. NRSC 2009. National
Conference_Location :
New Cairo
ISSN :
1110-6980
Print_ISBN :
978-1-4244-4214-0
Type :
conf
Filename :
5233485
Link To Document :
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