• DocumentCode
    501879
  • Title

    GMR heads as ESD detectors - a direct assessment of subtle ESD

  • Author

    Luo, J.S. ; Chin-Yu Yeh ; Sanayei, Ali

  • Author_Institution
    Storage Syst. Div., IBM, San Jose, CA, USA
  • fYear
    2001
  • fDate
    11-13 Sept. 2001
  • Firstpage
    316
  • Lastpage
    319
  • Abstract
    In this work, we demonstrate the importance and the effectiveness of using GMR heads as ESD detectors in new tester qualifications. Traditionally, to resolve ESD concerns of a new tester, a high bandwidth digital oscilloscope and a CT1 probe are often used for ESD waveform detection. An assessment is then provided based on the observed waveform. The methodology is largely consistent with investigations in a majority of papers published recently - a giant magnetoresistive (GMR) sensor is typically seen with catastrophic failure from SEM measurements if a sizable waveform is detected. As the scale of the GMR sensors reduces with each new product, it becomes essential to locate subtle ESD transient from the tester. This kind of transient will not cause any observable damage in SEM measurements and introduces nearly no resistance change. The transient, however, degrades magnetic performance of the sensor. The focus of the work is on transients that are more difficult to measure using an oscilloscope, and their impacts to the sensors are difficult to assess without direct measurements on the sensors.
  • Keywords
    electrostatic discharge; magnetoresistive devices; scanning electron microscopy; sensors; CT1 probe; ESD detectors; ESD waveform detection; GMR heads; GMR sensor; SEM measurement; catastrophic failure; giant magnetoresistive sensor; high bandwidth digital oscilloscope; magnetic performance; subtle ESD transient; tester qualification; Bandwidth; Detectors; Electrical resistance measurement; Electrostatic discharge; Giant magnetoresistance; Magnetic heads; Magnetic sensors; Oscilloscopes; Qualifications; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Overstress/Electrostatic Discharge Symposium, 2001. EOS/ESD '01.
  • Conference_Location
    Portland, OR
  • Print_ISBN
    978-1-5853-7039-9
  • Electronic_ISBN
    978-1-5853-7039-9
  • Type

    conf

  • Filename
    5254950