Title :
A study of GMR breakdown damage in cleaning
Author :
Deng, Fei ; Teng, ZhaoYu ; Li, William ; Tao, Rock
Author_Institution :
SAE Magnetics (HK) Ltd., Dongguan, China
Abstract :
Dielectric breakdown between MR leads and shields is a typical form of ESD damage. This paper reports an example of such damage occurring at the bar-level cleaning process. Damaged heads show no MR resistance & output changes and may be incorrectly attributed to failure due to corrosion. The investigation result unveils that charge exchange between high tribo-charge brush & GMR bonding pads is the key factor leading to breakdown.
Keywords :
cleaning; electric breakdown; giant magnetoresistance; magnetoresistive devices; ESD damage; GMR bonding pad; GMR breakdown damage; MR resistance; bar-level cleaning process; charge exchange; damaged heads; dielectric breakdown; high tribo-charge brush; output change; Breakdown voltage; Brushes; Cleaning; Corrosion; Dielectric breakdown; Electric breakdown; Electrostatic discharge; Hydrocarbons; Immune system; Solvents;
Conference_Titel :
Electrical Overstress/Electrostatic Discharge Symposium, 2001. EOS/ESD '01.
Conference_Location :
Portland, OR
Print_ISBN :
978-1-5853-7039-9
Electronic_ISBN :
978-1-5853-7039-9
