DocumentCode
501901
Title
Field emission noise caused by capacitance coupling ESD in AMR/GMR heads
Author
Ohtsu, Takayoshi ; Yoshida, Hitoshi ; Hatanaka, Noriaki
Author_Institution
Data Storage Syst. Div., Hitachi Ltd., Odawara, Japan
fYear
2001
fDate
11-13 Sept. 2001
Firstpage
171
Lastpage
173
Abstract
In AMR/GMR heads, we find that the field emission between shield and disk is induced by the high voltage of the write driver. This paper discusses the mechanism that the noise by field emission is the current to GMR elements caused by the capacitance coupling between shield and electrode.
Keywords
capacitance; driver circuits; electrostatic discharge; field emission; giant magnetoresistance; magnetic heads; magnetic recording noise; magnetoresistive devices; AMR heads; GMR heads; capacitance coupling ESD; field emission noise; magnetic recording; shield-disk field emission; write driver voltage; Capacitance; Coils; Electrodes; Electron beams; Electrostatic discharge; Frequency; Magnetic heads; Magnetic noise; Magnetic recording; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Overstress/Electrostatic Discharge Symposium, 2001. EOS/ESD '01.
Conference_Location
Portland, OR
Print_ISBN
978-1-5853-7039-9
Electronic_ISBN
978-1-5853-7039-9
Type
conf
Filename
5254973
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