Title :
Correlation considerations II: Real HBM to HBM testers
Author :
Barth, Jon ; Richner, John ; Verhaege, Koen ; Kelly, Mark ; Henry, Leo G.
Author_Institution :
Barth Electronics, Inc., 1589 Foothill Drive, Boulder City, NV 89005 USA
Abstract :
This work expands on earlier real HBM initial front rise (0 to 15 Volts) sub-nanosecond measurements with faster equipment using both 1 Ω and a 50 Ω resistance current sensors to identify the complete range of peak current and risetime of HBM discharges. Several accurate high-speed measurements were made which show real HBM being significantly faster, and that they can have higher peak currents than the present HBM test specification.
Keywords :
Circuit testing; Current measurement; Data analysis; Electrical resistance measurement; Electronic equipment testing; Humans; Protection; Pulse measurements; Sensor systems; System testing;
Conference_Titel :
2002 Electrical Overstress/Electrostatic Discharge Symposium, 2002. EOS/ESD '02.
Conference_Location :
Charlotte, NC, USA
Print_ISBN :
978-1-5853-7040-5
Electronic_ISBN :
978-1-5853-7040-5
