DocumentCode :
503059
Title :
ESD protection design for giga-Hz RF CMOS LNA with novel impedance-isolation technique
Author :
Ker, Ming-Dou ; Lee, Chien-Ming
Author_Institution :
Nanoelectron. & Gigascale Syst. Lab., Nat. Chiao-Tung Univ., Hsinchu, Taiwan
fYear :
2003
fDate :
21-25 Sept. 2003
Firstpage :
1
Lastpage :
10
Abstract :
A novel ESD protection design with impedance-isolation technique is proposed and successfully verified in a 0.25-mum CMOS process with top thick metal. Its purpose is to reduce the detrimental effect of the on-chip ESD protection circuit on the power gain and noise figure of an RF LNA circuit. With the resonance of LC-tank, the impedance generated from the ESD protection devices can be isolated from the input node of RF LNA at the operation frequency, so the power gain loss and noise figure of RF LNA can be successfully codesigned with the desired ESD robustness. The proposed ESD protection circuit with novel impedance-isolation technique will be one of the most effective ESD protection solutions for RF circuits in higher frequency band (> 10 GHz).
Keywords :
CMOS integrated circuits; UHF amplifiers; UHF integrated circuits; electrostatic discharge; low noise amplifiers; ESD protection design; LC-tank resonance; RF CMOS LNA; impedance-isolation technique; noise figure; on-chip ESD protection circuit; power gain; size 0.25 mum; CMOS process; Circuits; Electrostatic discharge; Impedance; Noise figure; Noise robustness; Power generation; Protection; Radio frequency; Resonance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Overstress/Electrostatic Discharge Symposium, 2003. EOS/ESD '03.
Conference_Location :
Las Vegas, NV
Print_ISBN :
978-1-5853-7057-3
Electronic_ISBN :
978-1-5853-7057-3
Type :
conf
Filename :
5272022
Link To Document :
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