New methods for the assessment of ESD threats to electronic components

We propose new methods for the assessment of real ESD threats to electronic components in modern electronics manufacturing environment. The methods are the use of current threshold for damage for ESD from a source into a device, energy threshold for damage for very short ESD pulses to a device, and charge threshold for CDM type of ESD. We suggest how guideline limits for ESD damage thresholds may be derived. The concept of the current threshold has been tested by experiments.