DocumentCode
503114
Title
New plasma cleaning technology
Author
Windemuth, Reinhard ; Nonomura, Masaru ; Dunn, Gene
Author_Institution
PFSE, Panasonic Ind. Eur. GmbH, Munich, Germany
fYear
2009
fDate
15-18 June 2009
Firstpage
1
Lastpage
5
Abstract
Plasma cleaning technology is used for different applications in backend packaging applications. Plasma cleaning is used to improve capability and performance of: (a) wirebonding (etching) (b) thermosonic flipchip (etching) (c) underfill (surface activation) This presentation sets focus on individual process solutions how to improve those backend processes. Different demands on process and equipment come from different applications. Both etching and surface activation and their special solutions are described. Some mathematical simulations are described. Effect of special gas additive to improve underfill cleaning process results is shown. Challenges for underfill with large die and small gap and underneath the die are shown and solutions explained. Challenges for bondpad cleaning by Argon etching for wirebonding and GGI flipchip are shown and solutions explained. Methods of process and surface analysis like Auger analysis and contact angle measurement and others will be described.
Keywords
Auger electron spectra; contact angle; flip-chip devices; integrated circuit bonding; integrated circuit packaging; plasma materials processing; sputter etching; tape automated bonding; Auger analysis; GGI flipchip; argon etching; backend packaging; bondpad cleaning; contact angle; gas additive; microelectronics packaging; plasma cleaning technology; surface activation; surface analysis; thermosonic flipchip; underfill cleaning; wirebonding; Argon; Bonding; Cleaning; Electrodes; Etching; Gold; Nickel; Plasma applications; Plasma materials processing; Wire; Argon cleaning; Auger Analysis Parallel; Epoxy fillet; GGI Flipchip; Oxygen; P1. Plasma cleaning in micro-packaging applications; P2. Wire bonding; P3. Spectroscopy; P4. Contact angle; P5. Processing time; RF generator; Seap in time; depth profile; physical etching effect; plate chamber; surface modification; underfill; underfill capillary; vacuum; viscosity; wettability;
fLanguage
English
Publisher
ieee
Conference_Titel
Microelectronics and Packaging Conference, 2009. EMPC 2009. European
Conference_Location
Rimini
Print_ISBN
978-1-4244-4722-0
Electronic_ISBN
978-0-6152-9868-9
Type
conf
Filename
5272876
Link To Document