• DocumentCode
    503125
  • Title

    Size and microstructure effects on the stress-strain behaviour of lead-free solder joints

  • Author

    Hegde, Pradeep ; Whalley, David C. ; Silberschmidt, Vadim V.

  • Author_Institution
    Wolfson Sch. of Mech. & Manuf. Eng., Loughborough Univ., Loughborough, UK
  • fYear
    2009
  • fDate
    15-18 June 2009
  • Firstpage
    1
  • Lastpage
    9
  • Abstract
    The properties of lead-free solders such as Sn3.8Ag0.7Cu are less understood than traditional Sn-Pb solders, as well as the factors affecting these material properties. Therefore, the present paper focuses on determination of stress-strain properties for both small-scale solder joints and for bulk solder for three different strain rates. The paper also analyses the obtained experimental results, and compares material properties between the solder joint and the bulk solder. The reasons for the differences in the observed material properties are discussed, and their effects are separated through the use of finite-element analysis.
  • Keywords
    copper alloys; finite element analysis; lead alloys; silver alloys; solders; stress-strain relations; tin alloys; SnAgCu; SnPb; bulk solder; finite-element analysis; microstructure effects; solder joints; stress-strain behaviour; Electronic packaging thermal management; Environmentally friendly manufacturing techniques; Fabrication; Finite element methods; Joining materials; Lead; Material properties; Microstructure; Soldering; Thermal expansion; Lead-free; Sn3.8Ag0.7Cu; Stress-strain; size effect and microstructure effect;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microelectronics and Packaging Conference, 2009. EMPC 2009. European
  • Conference_Location
    Rimini
  • Print_ISBN
    978-1-4244-4722-0
  • Electronic_ISBN
    978-0-6152-9868-9
  • Type

    conf

  • Filename
    5272887