Interface resistance between polymer based conducting and resistive layers

We have studied the interface resistance between the polymer based conducting and resistive thick film layers. The samples were made using different resistive pastes and dipping silvers. The composite of carbon and graphite (C/Gr) conducting particles suspended in different polymer vehicles were used for the thick film resistive layers preparation. Interface resistance R_I created between the contact layer made from dipping silver (DiAg) and resistive layer was determined from the surface potential distribution measurements and its value was less than 1% of total sample resistance. Measuring apparatus DISPOTreg designed in our laboratory provides the measuring of a surface potential distribution. The measuring probe is sliding on the surface of measured structure and potential change between the successive steps is normalized by the total current flowing through the structure. Elementary step (the shortest distance between two measurements) is 1.25 mum. The equipment is arranged for current and voltage four-point measurement. Jump in potential on the interface between DiAg and C/Gr layer corresponds to the contact resistance R_I which is created between these layers. Interface resistance plays important role in the capacitors technology thus the analysis of the charge carrier transport through the interface between different layers can be used to improve the low ESR capacitors technology.