Mixed-Mode simulation of single event upsets in modern SiGe BiCMOS mixed-signal circuits

Author

Turowski, Marek ; Raman, Ashok ; Fedoseyev, Alex

Author_Institution

CFD Res. Corp. (CFDRC), Huntsville, AL, USA

fYear

2009

fDate

25-27 June 2009

Firstpage

462

Lastpage

467

Abstract

The latest enhancements to CFDRC NanoTCAD mixed-mode simulator, combining 3D physics-based device models and advanced circuit compact models (VBIC, Mextram) for advanced bipolar devices, as well as unique mixed-mode coupling of 3D TCAD models with the Cadence Spectre circuit simulator, have enabled simulations and in-operation analysis of ionizing radiation single event effects (SEEs) in modern high-speed SiGe BiCMOS technologies and integrated circuits. An example of simulation of SEEs affecting digital output of a 7.2 GHz mixed-signal circuit are presented. Our mixed-mode modeling results compare very well with experimental data.

Keywords

BiCMOS analogue integrated circuits; BiCMOS digital integrated circuits; Ge-Si alloys; mixed analogue-digital integrated circuits; semiconductor materials; technology CAD (electronics); 3D TCAD models; 3D physics-based device models; BiCMOS mixed-signal circuits; CFDRC NanoTCAD mixed-mode simulator; Cadence Spectre circuit simulator; Mextram models; SiGe; VBIC models; advanced circuit compact models; bipolar devices; frequency 7.2 GHz; ionizing radiation single event effects; mixed-mode simulation; single event upsets; Analytical models; BiCMOS integrated circuits; Circuit simulation; Coupling circuits; Discrete event simulation; Germanium silicon alloys; Integrated circuit modeling; Nanoscale devices; Silicon germanium; Single event upset; 3D; HBT; Mextram; NanoTCAD; Spectre; TCAD; VBIC; device simulation; mixed-mode; physics-based modeling; single event effects;

fLanguage

English

Publisher

ieee

Conference_Titel

Mixed Design of Integrated Circuits & Systems, 2009. MIXDES '09. MIXDES-16th International Conference

Conference_Location

Lodz

Print_ISBN

978-1-4244-4798-5

Electronic_ISBN

978-83-928756-1-1

Type

conf

Filename

5289656