DocumentCode :
50366
Title :
A Two-Order Increase in Robustness of Partial Redundancy Under a Radiation Stress Test by Using SDC Prediction
Author :
Ahmed, Toufik ; Jun Yao ; Nakashima, Yuta
Author_Institution :
Grad. Sch. of Inf. Sci., Nara Inst. of Sci. & Technol., Nara, Japan
Volume :
61
Issue :
4
fYear :
2014
fDate :
Aug. 2014
Firstpage :
1567
Lastpage :
1574
Abstract :
Partial redundancy is a method to address errors from single event effects (SEEs) on critical data while leaving less important data unprotected for energy consumption trade-offs. Under a low SEE rate, the method can provide a good cost-effective fault tolerance, while many silent data corruptions (SDCs) may occur under a high fault rate due to an incomplete fault coverage. This paper proposes a system-level approach to additionally covering SDCs in a partial redundancy by a light-weighted error prediction. Our results from a simulation under a stress radiation test condition show that with an average 8% cost in energy consumption, we can reduce the SDC rate from 12% to 0.37%, for the work loads that we studied.
Keywords :
radiation hardening (electronics); redundancy; SDC prediction; energy consumption trade-offs; fault tolerance; partial redundancy; radiation stress test; robustness; silent data corruptions; single event effects; Arrays; Energy consumption; Error analysis; Indexes; Redundancy; Energy consumption; fault tolerance; redundancy;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.2014.2314691
Filename :
6832653
Link To Document :
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