Title :
Computer-aided measurements and rejection of high power microwave transistors on a wafer
Author :
Galdetskiy, A.V. ; Vorobiev, A.A.
Author_Institution :
FSUE Istok, Fryazino, Russia
Abstract :
A computer-aided set-up and software are developed for characterization and rejecting of high power microwave transistors on a wafer. To overcome spurious oscillations and increase the accuracy of measurements a special multipin probe is fabricated. The developed software gives opportunities to realize complicated scripts of measurements and testing.
Keywords :
computerised instrumentation; electronic engineering computing; microwave transistors; oscillations; wafer-scale integration; computer-aided measurements; computer-aided set-up; high power microwave transistors; multipin probe; spurious oscillations; wafer; Gallium arsenide; Helium; IEEE catalog; Microwave measurements; Microwave transistors; Organizing; Power measurement; Probes;
Conference_Titel :
Microwave & Telecommunication Technology, 2009. CriMiCo 2009. 19th International Crimean Conference
Conference_Location :
Sevastopol
Print_ISBN :
978-1-4244-4796-1
