• DocumentCode
    505359
  • Title

    Modelling of the low-frequency solvent dielectric permittivity in nanochannels in the Electrical Double Layer length range

  • Author

    Ioanid, Ana ; Dafinei, A.S.

  • Author_Institution
    Fac. of Phys., Univ. of Bucharest, Romania
  • Volume
    1
  • fYear
    2009
  • fDate
    12-14 Oct. 2009
  • Firstpage
    139
  • Lastpage
    142
  • Abstract
    The charged solid-liquid interface parameter is increased importance in nanochannels since they have a high surface-to-volume ratio. The nano fluidics transport depends essential on the nano pores geometry and their surface properties. Surface charge is caused by the dissociation of surface groups and the specific (no electric) adsorptions of ions and molecules in solution to the surface. A typical value of high charge density and fully ionized surface is sigmas = 0.3 cm-2, corresponding to one charge per ~ 0.5 nm2. The screening charge region of the surface neighborhood is denoted Electrical Double Layer (EDL) and results in electrostatic forces which govern transport in nano fluidic systems.
  • Keywords
    adsorption; channel flow; dielectric liquids; dissociation; electrochemistry; interface phenomena; nanofluidics; permittivity; surface charging; charge density; charged solid-liquid interface parameter; dielectric permittivity; electrical double layer; electrostatic forces; ion adsorption; low-frequency solvent; molecular adsorption; nanochannels; nanofluidics transport; nanopore geometry; surface charge; surface group dissociation; surface neighborhood screening charge region; surface-to-volume ratio; Atomic layer deposition; Counting circuits; Dielectrics; Dispersion; Electrostatics; Fluidics; Permittivity; Poisson equations; Solids; Solvents; dielectric analysis; electrical double layer; lowfrequency permittivity; nano fluidics; temporal and spatial dispersion;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Conference, 2009. CAS 2009. International
  • Conference_Location
    Sinaia
  • ISSN
    1545-827X
  • Print_ISBN
    978-1-4244-4413-7
  • Type

    conf

  • DOI
    10.1109/SMICND.2009.5336587
  • Filename
    5336587