• DocumentCode
    505482
  • Title

    Impact of moisture absorption on warpage of large BGA packages during a lead-free reflow process

  • Author

    Vandevelde, B. ; Deweerdt, R. ; Duflos, F. ; Gonzalez, M. ; Vanderstraeten, D. ; Blansaer, Eddy ; Brizar, Guy ; Gillon, Renaud

  • Author_Institution
    IMEC, Leuven, Belgium
  • fYear
    2009
  • fDate
    7-9 Oct. 2009
  • Firstpage
    113
  • Lastpage
    116
  • Abstract
    During a solder reflow process, IC components deform under a rather excessive temperature loading. A too high warpage at temperatures above solder melting, can cause either that the joints in the corner are not soldered to the PCB pads, or that the solder joints are shorted due to compressing of the corner joints. In this work, the warpage of a 35by35 mm2 large PBGA package has been measured during a temperature profile which is similar to a lead-free soldering process. It was found that the warpage becomes very high when the applied temperature is above the glass transition temperature of the overmould material. At that moment, there exists a very large CTE mismatch between the overmould and the BT laminate. The warpage measurements have been successfully verified by finite element modelling adapting the right material properties. This proves that modeling can be used as an estimator of warpage for packages. Also the impact of initial moisture uptake has been experimentally investigated and it was shown that it has a dominant effect on its warpage behaviour.
  • Keywords
    ball grid arrays; finite element analysis; glass transition; finite element modelling; glass transition temperature; large BGA packages; lead-free reflow process; moisture absorption; overmould material; warpage; warpage measurements; Absorption; Environmentally friendly manufacturing techniques; Finite element methods; Glass; Laminates; Lead; Moisture; Packaging; Soldering; Temperature measurement; FEM simulation; PBGA; Warpage; solder reflow; topography measurements thermo-mechanical stress;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Thermal Investigations of ICs and Systems, 2009. THERMINIC 2009. 15th International Workshop on
  • Conference_Location
    Leuven
  • Print_ISBN
    978-1-4244-5881-3
  • Type

    conf

  • Filename
    5340059