Title :
Progress in thermal characterisation methods and thermal interface technology within the “Nanopack” project
Author :
Wunderle, B. ; Ras, M. Abo ; Klein, M. ; Mrossko, R. ; Engelmann, G. ; May, D. ; Wittler, O. ; Schacht, R. ; Dietrich, L. ; Oppermann, H. ; Michel, B.
Author_Institution :
Fraunhofer Inst. Reliability & Microintegration, Berlin, Germany
Abstract :
As the demand for new thermal technologies and materials has been increasing over the years to provide thermal solutions to the next generation of power electronics, microprocessors and high-power optical systems also thermal characterisation methods have to keep up with the pace of this development with respect to resolution and accuracy. Within the EU-funded project ldquoNanopackrdquo we have developed both bulk and interface technologies to reduce thermal resistance using Ag-based materials and low-T and low-p processes to render them eligible for the electronics industry. New processes to generate nano-enhanced surface structures as well as thermo-compression bonding are examined within this paper. Along with these processes especially designed test stands are described which are able to extract the effects achieved by the technological advances.
Keywords :
materials testing; nanostructured materials; nanotechnology; silver; surface structure; tape automated bonding; thermal resistance; Ag; Ag-based materials; Nanopack project; nanoenhanced surface structures; test stand design; thermal characterisation method; thermal interface material; thermal interface technology; thermal packaging; thermal resistance; thermocompression bonding; Bonding; Electronics industry; Microprocessors; Nanostructures; Optical materials; Power electronics; Process design; Rendering (computer graphics); Surface structures; Thermal resistance;
Conference_Titel :
Thermal Investigations of ICs and Systems, 2009. THERMINIC 2009. 15th International Workshop on
Conference_Location :
Leuven
Print_ISBN :
978-1-4244-5881-3