Title :
Calibration of very fast TLP transients
Author :
Linten, D. ; Roussel, P. ; Scholz, M. ; Thijs, S. ; Griffoni, A. ; Sawada, M. ; Hasebe, T. ; Groeseneken, G.
Author_Institution :
IMEC vzw, Leuven, Belgium
fDate :
Aug. 30 2009-Sept. 4 2009
Abstract :
A calibration methodology for transient analysis of voltage and current waveforms during VFTLP testing is presented. An OPEN, SHORT and LOAD calibration are required to de-embed the probe needles and system parasitics. This enables the use of non-RF probes for VFTLP measurements, resulting in a lower cost and higher measurement flexibility for VFTLP testing.
Keywords :
calibration; electrostatic discharge; integrated circuit testing; transients; ESD; VFTLP testing; calibration; current waveforms; load calibration; nonRF probes; open calibration; probe needles; short calibration; system parasitics; transient analysis; very fast TLP transients; voltage waveforms; Calibration; Costs; Loss measurement; Needles; Probes; Radio frequency; Testing; Transient analysis; Transient response; Voltage;
Conference_Titel :
EOS/ESD Symposium, 2009 31st
Conference_Location :
Anaheim, CA
Print_ISBN :
978-1-58537-176-1
Electronic_ISBN :
978-1-58537-176-1
