• DocumentCode
    507376
  • Title

    GHM: A generalized Hamiltonian method for passivity test of impedance/admittance descriptor systems

  • Author

    Zhang, Zheng ; Lei, Chi-Un ; Wong, Ngai

  • Author_Institution
    Dept. of Electr. & Electron. Eng., Univ. of Hong Kong, Hong Kong, China
  • fYear
    2009
  • fDate
    2-5 Nov. 2009
  • Firstpage
    767
  • Lastpage
    773
  • Abstract
    A generalized Hamiltonian method (GHM) is proposed for passivity test of descriptor systems (DSs) which describe impedance or admittance input-output responses. GHM can test passivity of DSs with any system index without minimal realization. This frequency-independent method can avoid the time-consuming system decomposition as required in many existing DS passivity test approaches. Furthermore, GHM can test systems with singular D + DT where traditional Hamiltonian method fails, and enjoys a more accurate passivity violation identification compared to frequency sweeping techniques. Numerical results have verified the effectiveness of GHM. The proposed method constitutes a versatile tool to speed up passivity check and enforcement of DSs and subsequently ensures globally stable simulations of electrical circuits and components.
  • Keywords
    VLSI; electric admittance; electric impedance; integrated circuit modelling; VLSI circuits; admittance input-output responses; descriptor systems; electrical circuits; electrical components; frequency sweeping techniques; frequency-independent method; generalized Hamiltonian method; globally stable simulations; impedance input-output responses; passivity check; passivity test; passivity violation identification; Admittance; Circuit simulation; Circuit testing; Decision support systems; Electronic equipment testing; Frequency; Impedance; RLC circuits; System testing; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer-Aided Design - Digest of Technical Papers, 2009. ICCAD 2009. IEEE/ACM International Conference on
  • Conference_Location
    San Jose, CA
  • ISSN
    1092-3152
  • Print_ISBN
    978-1-60558-800-1
  • Electronic_ISBN
    1092-3152
  • Type

    conf

  • Filename
    5361209