DocumentCode
508984
Title
Modeling of Moisture Test for Grain Based on BP Neural Network and Dielectric Loss Factor
Author
Jiang, Jishun ; Ji, Hua
Author_Institution
Dept. of Electr. & Electron. Eng., Shandong Univ. of Technol., Zibo, China
Volume
1
fYear
2009
fDate
12-14 Dec. 2009
Firstpage
424
Lastpage
428
Abstract
This paper introduces the multiple sensing mechanism of online moisture test for grain and improved BP neural network, and gives hardware structure of moisture test system for grain centering on TMS320F2812. In this paper, dielectric loss factor is measured by the method of orthogonal separation on phase-sensitive detection. Though measuring three parameters of dielectric loss factor, power fluctuations and temperature changes, using BP neural network to construct multi-input single-output model, applying gradient descent method with forgetting factor for parameters adjustment of BP neural network, utilizing the nonlinear mapping ability and learning generalization ability of the BP neural network, and using high precision samples for the training of BP neural network, the mathematic model of moisture test system for grain based on BP neural network was established finally. The sample testing experiment shows that the measurement accuracy obtains a great enhancement comprehensively considering the effect on testing output with the aim sensor characteristic and non-aim parameter.
Keywords
agricultural products; backpropagation; moisture; neural nets; BP neural network; TMS320F2812; dielectric loss factor; forgetting factor; generalization ability; gradient descent method; grain centering; multi-input single-output model; multiple sensing mechanism; nonlinear mapping ability; online moisture test system; phase-sensitive detection; Dielectric loss measurement; Dielectric losses; Dielectric measurements; Loss measurement; Mathematical model; Moisture; Neural network hardware; Neural networks; Phase measurement; System testing; BP neural network; dielectric loss factor; grain moisture; online test;
fLanguage
English
Publisher
ieee
Conference_Titel
Computational Intelligence and Design, 2009. ISCID '09. Second International Symposium on
Conference_Location
Changsha
Print_ISBN
978-0-7695-3865-5
Type
conf
DOI
10.1109/ISCID.2009.114
Filename
5368913
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