DocumentCode :
510333
Title :
Research on dielectric properties of gallium arsenides by using THz-TDS
Author :
Jiusheng, Li ; Xiaoli, Zhao
Author_Institution :
Centre for THz Research, China Jiliang University, Hangzhou 310018, China
fYear :
2009
fDate :
2-6 Nov. 2009
Firstpage :
1
Lastpage :
2
Abstract :
By using terahertz time domain spectroscopy (THz-TDS) system, the terahertz dielectric properties of various gallium arsenides were tested in the frequency range extending from 0.2 to 1.5 THz. The power absorption coefficient and refractive index of various resistivity gallium arsenides were measured and compared. The refractive index of the high resistivity and ultra-high resistivity GaAs are equal to be 6.53 and 5.9, respectively. The variation of the refractive index of the GaAs was less than 1%, ranging from 0.2 to 1.5THz, but the absorption coefficient of the ultra-resistivity GaAs showed very different frequency-dependent behaviors, ranging from 0.02cm−1 to 2.21cm−1, within the investigated frequency range. The results show that the ultra-resistivity GaAs will be a good candidate material for terahertz transmission waveguide.
Keywords :
Absorption; Conductivity; Dielectrics; Electrochemical impedance spectroscopy; Frequency; Gallium arsenide; Laser beams; Refractive index; Semiconductor materials; Ultrafast optics;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Communications and Photonics Conference and Exhibition (ACP), 2009 Asia
Conference_Location :
Shanghai, China
Print_ISBN :
978-1-55752-877-3
Electronic_ISBN :
978-1-55752-877-3
Type :
conf
Filename :
5376992
Link To Document :
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