• DocumentCode
    51152
  • Title

    Inline capacitive RF power sensor based on floating MEMS beam for GaAs MMIC applications

  • Author

    Zhiqiang Zhang ; Xiaoping Liao

  • Author_Institution
    Key Lab. of MEMS of the Minist. of Educ., Southeast Univ., Nanjing, China
  • Volume
    50
  • Issue
    18
  • fYear
    2014
  • fDate
    August 28 2014
  • Firstpage
    1292
  • Lastpage
    1294
  • Abstract
    A 0.01-20 GHz inline capacitive radio frequency (RF) power sensor with a floating microelectromechanical system (MEMS) beam is proposed. It is based on sensing the capacitance change of the MEMS beam above the coplanar waveguide line due to the electrostatic force. In the design, anchors of the MEMS beam are floating for accurate capacitive detection and flexible for increasing the sensitivity, and an impedance matching technique is utilised to improve the microwave performance. The fabrication of this sensor is compatible with the GaAs monolithic microwave integrated circuits (MMICs) process. The measured reflection loss of the capacitive sensor is <;-18 dB, whereas the insertion loss is better than -0.38 dB up to 20 GHz. Experiments show that approximate linear relationships between the measured capacitance change and the input RF power are obtained, and the resulting average sensitivities are 120.8, 76.7, 87.6 and 61.0 aF/mW at 5, 10, 15 and 20 GHz, respectively.
  • Keywords
    III-V semiconductors; MMIC; coplanar waveguides; electrostatics; gallium arsenide; impedance matching; microsensors; GaAs; MEMS beam capacitance change; capacitive detection; coplanar waveguide line; electrostatic force; floating MEMS beam; floating microelectromechanical system beam; frequency 0.01 GHz to 20 GHz; gallium arsenide MMIC application; gallium arsenide monolithic microwave integrated circuit process; impedance matching technique; inline capacitive RF power sensor; inline capacitive radiofrequency power sensor; input RF power; measured capacitance change; measured reflection loss; microwave performance;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el.2014.2345
  • Filename
    6888568