DocumentCode
511677
Title
Distance Metric Learning for Ameliorated Nonnegative Matrix Factorization
Author
He, Xu-lan ; Zhang, Zhao
Author_Institution
Sch. of Inf. Technol., Nanjing Forestry Univ., Nanjing, China
Volume
1
fYear
2009
fDate
28-30 Oct. 2009
Firstpage
511
Lastpage
515
Abstract
Non-negative matrix factorization (NMF) is an unsupervised method whose aim is to find an approximate factorization V ¿ WH, which decomposes V = [vij] ¿ Rn*m into non-negative matrices W = [wij] ¿ Rn*r and H = [hij] ¿ Rr*m with wij, hij ¿ 0. In this paper, we present an extension to the non-negative matrix factorization called DMNMF and adopt the learned distance metric to measure the between-class similarity of two patterns and minimize F(V; WH) = ¿V - WH¿2 A, which is equivalent to finding a rescaling of a data, applying the standard Euclidean metric to the rescaled data, and this will later be useful in visualizing the learned metrics. DMNMF has been tested with color wood images after combining the statistical features based on energy extracted via dual-tree complex wavelet transform (DTCWT) from the feature spaces structured by the factorization process for wood image representation and defect detection. Based on visual valuation, it can effectively decrease the experimental errors and have better robust to the interferences on wood surfaces with better convergence property and similarity measures. The experimental results show the proposed method is effectual and practical with good research values and potential applications.
Keywords
feature extraction; image colour analysis; image representation; matrix decomposition; minimisation; unsupervised learning; wavelet transforms; Euclidean metric; ameliorated nonnegative matrix factorization; between-class similarity; color wood images; data recaling; defect detection; distance metric learning; dual-tree complex wavelet transform; image representation; minimization; statistical features; unsupervised method; Color; Cost accounting; Data mining; Data visualization; Euclidean distance; Image representation; Matrix decomposition; Measurement standards; Testing; Wavelet transforms; Distance metric learning; Knot defects recognition; Nonnegative matrix factorization; Similarity measure; Wood image representation;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer Science and Engineering, 2009. WCSE '09. Second International Workshop on
Conference_Location
Qingdao
Print_ISBN
978-0-7695-3881-5
Type
conf
DOI
10.1109/WCSE.2009.721
Filename
5403414
Link To Document