• DocumentCode
    511677
  • Title

    Distance Metric Learning for Ameliorated Nonnegative Matrix Factorization

  • Author

    He, Xu-lan ; Zhang, Zhao

  • Author_Institution
    Sch. of Inf. Technol., Nanjing Forestry Univ., Nanjing, China
  • Volume
    1
  • fYear
    2009
  • fDate
    28-30 Oct. 2009
  • Firstpage
    511
  • Lastpage
    515
  • Abstract
    Non-negative matrix factorization (NMF) is an unsupervised method whose aim is to find an approximate factorization V ¿ WH, which decomposes V = [vij] ¿ Rn*m into non-negative matrices W = [wij] ¿ Rn*r and H = [hij] ¿ Rr*m with wij, hij ¿ 0. In this paper, we present an extension to the non-negative matrix factorization called DMNMF and adopt the learned distance metric to measure the between-class similarity of two patterns and minimize F(V; WH) = ¿V - WH¿2 A, which is equivalent to finding a rescaling of a data, applying the standard Euclidean metric to the rescaled data, and this will later be useful in visualizing the learned metrics. DMNMF has been tested with color wood images after combining the statistical features based on energy extracted via dual-tree complex wavelet transform (DTCWT) from the feature spaces structured by the factorization process for wood image representation and defect detection. Based on visual valuation, it can effectively decrease the experimental errors and have better robust to the interferences on wood surfaces with better convergence property and similarity measures. The experimental results show the proposed method is effectual and practical with good research values and potential applications.
  • Keywords
    feature extraction; image colour analysis; image representation; matrix decomposition; minimisation; unsupervised learning; wavelet transforms; Euclidean metric; ameliorated nonnegative matrix factorization; between-class similarity; color wood images; data recaling; defect detection; distance metric learning; dual-tree complex wavelet transform; image representation; minimization; statistical features; unsupervised method; Color; Cost accounting; Data mining; Data visualization; Euclidean distance; Image representation; Matrix decomposition; Measurement standards; Testing; Wavelet transforms; Distance metric learning; Knot defects recognition; Nonnegative matrix factorization; Similarity measure; Wood image representation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Science and Engineering, 2009. WCSE '09. Second International Workshop on
  • Conference_Location
    Qingdao
  • Print_ISBN
    978-0-7695-3881-5
  • Type

    conf

  • DOI
    10.1109/WCSE.2009.721
  • Filename
    5403414