• DocumentCode
    512086
  • Title

    Study of IQ imbalance effect in direct-detection optical OFDM systems

  • Author

    Li, Xinying ; Shao, Yufeng ; Zou, Shumin ; Hou, Chunning ; Zheng, Xi ; Liu, Xiao ; Zhang, Junwen ; Fang, Wuliang ; Chi, Nan

  • Author_Institution
    The State Key Lab of ASIC & System, Department of Communication Science and Engineering, Fudan University, Shanghai, 200433, China
  • Volume
    2009-Supplement
  • fYear
    2009
  • fDate
    2-6 Nov. 2009
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    In-phase/quadrature-phase (IQ) imbalance can result in severe performance degradation in optical direct-detection orthogonal-frequency-division-multiplexing (DD-OFDM) systems. We build two optical back-to-back DD-OFDM systems, which implement double-sideband (DSB) and single-sideband (SSB) modulation, respectively. The tolerance to IQ imbalance of these two systems is analyzed and compared using error vector magnitude (EVM) and symbol error rate (SER). We find that, in the back-to-back case, the DSB system has stronger robustness to IQ imbalance than the SSB System. We further build two optical DD-OFDM systems each with 40-km transmission, which respectively implement DSB and SSB transmission. Similarly, we analyze and compare the tolerance to IQ imbalance of these two systems in terms of EVM and SER. We find that, however, in the case of 40-km transmission, the SSB system has stronger robustness to IQ imbalance than the DSB system. As a result, we conclude that, in the case of transmission, SSB modulation can enhance the tolerance to IQ imbalance of DD-OFDM systems.
  • Keywords
    Amplitude modulation; Application specific integrated circuits; Degradation; High speed optical techniques; OFDM modulation; Optical modulation; Optical receivers; Optical transmitters; Robustness; System performance; Back to back; DD-OFDM; DSB modulation; EVM; IQ imbalance; SER; SSB modulation; Timing jitter;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Communications and Photonics Conference and Exhibition (ACP), 2009 Asia
  • Conference_Location
    Shanghai, China
  • Print_ISBN
    978-1-55752-877-3
  • Electronic_ISBN
    978-1-55752-877-3
  • Type

    conf

  • Filename
    5405355