DocumentCode
512446
Title
Reliability test to key components of radio fuze under high impact and high temperature
Author
Zhang Ya ; Li Bo ; Zhang Hongxiang
Author_Institution
Mech. & Electron. Eng. Inst., North Univ. of China, Taiyuan, China
Volume
2
fYear
2009
fDate
19-20 Dec. 2009
Firstpage
415
Lastpage
417
Abstract
Key components play a key role in electronic products, this study presents a method for the reliability test of key components in radio fuzes. Due to the high impact force and the high temperature are main environmental stresses of radio fuzes on work, so the kernel of its reliability test is high impact test and high temperature test. Furthermore, dynamic testing experiment schemes are worked out to test the parameter of certain key components of radio fuzes, which are thyratron switches used in detonating circuits and Porcelain capacitor used in anti-jamming circuits and tantalum capacitor used in firing circuits subjected to two special conditions of high temperature and high impact. So this test schemes and results can offer important useful value to Radio Fuzes´ key components selection, filtration and other test.
Keywords
electric fuses; electronic products; impact (mechanical); impact testing; jamming; reliability; anti-jamming circuits; dynamic testing; electronic products; environmental stresses; filtration; high impact; high temperature; porcelain capacitor; radio fuze components; reliability test; tantalum capacitor; thyratron switches; Circuit testing; Electronic equipment testing; Kernel; Porcelain; Stress; Switched capacitor circuits; Switches; Switching circuits; Temperature; Thyratrons; Key components of Radio Fuzes; dynamic test; high impact; high temperature; reliability test;
fLanguage
English
Publisher
ieee
Conference_Titel
Power Electronics and Intelligent Transportation System (PEITS), 2009 2nd International Conference on
Conference_Location
Shenzhen
Print_ISBN
978-1-4244-4544-8
Type
conf
DOI
10.1109/PEITS.2009.5406749
Filename
5406749
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