• DocumentCode
    512446
  • Title

    Reliability test to key components of radio fuze under high impact and high temperature

  • Author

    Zhang Ya ; Li Bo ; Zhang Hongxiang

  • Author_Institution
    Mech. & Electron. Eng. Inst., North Univ. of China, Taiyuan, China
  • Volume
    2
  • fYear
    2009
  • fDate
    19-20 Dec. 2009
  • Firstpage
    415
  • Lastpage
    417
  • Abstract
    Key components play a key role in electronic products, this study presents a method for the reliability test of key components in radio fuzes. Due to the high impact force and the high temperature are main environmental stresses of radio fuzes on work, so the kernel of its reliability test is high impact test and high temperature test. Furthermore, dynamic testing experiment schemes are worked out to test the parameter of certain key components of radio fuzes, which are thyratron switches used in detonating circuits and Porcelain capacitor used in anti-jamming circuits and tantalum capacitor used in firing circuits subjected to two special conditions of high temperature and high impact. So this test schemes and results can offer important useful value to Radio Fuzes´ key components selection, filtration and other test.
  • Keywords
    electric fuses; electronic products; impact (mechanical); impact testing; jamming; reliability; anti-jamming circuits; dynamic testing; electronic products; environmental stresses; filtration; high impact; high temperature; porcelain capacitor; radio fuze components; reliability test; tantalum capacitor; thyratron switches; Circuit testing; Electronic equipment testing; Kernel; Porcelain; Stress; Switched capacitor circuits; Switches; Switching circuits; Temperature; Thyratrons; Key components of Radio Fuzes; dynamic test; high impact; high temperature; reliability test;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Electronics and Intelligent Transportation System (PEITS), 2009 2nd International Conference on
  • Conference_Location
    Shenzhen
  • Print_ISBN
    978-1-4244-4544-8
  • Type

    conf

  • DOI
    10.1109/PEITS.2009.5406749
  • Filename
    5406749