DocumentCode :
512684
Title :
Power Dissipation in SWCNT-interconnect
Author :
Rai, Mayank Kumar ; Spandana, G. ; Nivedita ; Sarkar, S.
Author_Institution :
Dept. of Electron. & Comm. Eng., Thapar Univ., Patiala, India
fYear :
2009
fDate :
14-16 Dec. 2009
Firstpage :
1
Lastpage :
4
Abstract :
This paper addresses power dissipation in single walled carbon nanotube bundle interconnect for VLSI applications at 22 nm technology node. SPICE simulation shows that due to high capacitance, SWCNT-bundle interconnect is of higher power dissipation than copper interconnect. Power dissipation decreases with increase in tube diameter of the constituent SWCNTs. CNT interconnect resistance and inductance increases with increase in diameter and length. On the other hand, with increase in tube diameter interconnect capacitance decreases. However, increase in interconnect length increases the capacitance. Our analysis shows that choice of tube diameter is critical for good power management.
Keywords :
SPICE; VLSI; carbon nanotubes; equivalent circuits; interconnections; nanotechnology; C; SPICE simulation; SWCNT-interconnect; VLSI applications; interconnect inductance; interconnect resistance; power dissipation; single walled carbon nanotube; size 22 nm; Carbon nanotubes; Contact resistance; Electrostatics; Equivalent circuits; Inductance; Integrated circuit interconnections; Power dissipation; Quantum capacitance; Radio frequency; SPICE; Carbon nanotube (CNT); Single walled carbon nanotube(SWCNT); simulation program with integrated circuit emphasis (SPICE);
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computers and Devices for Communication, 2009. CODEC 2009. 4th International Conference on
Conference_Location :
Kolkata
Print_ISBN :
978-1-4244-5073-2
Type :
conf
Filename :
5407251
Link To Document :
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