Title :
Scaling VCSEL reliability up to 250Terabits/s of system bandwidth
Author :
Cunningham, J.E. ; Beckman, D. ; McElfresh, D. ; Forrest, C. ; Cohen, David ; Krishnamoorthy, A.V.
Author_Institution :
SSG Phys. Sci. Center, SUN Microsyst., San Diego, CA, USA
Abstract :
We evaluate VCSEL reliability for next-generation High Productivity Computers in which several hundreds of terabits of bandwidth are envisioned. An empirical relationship for VCSEL scaling versus bit rate and aperture is presented in order to explore reliability of VCSEL-based links. Reliability is found to degrade with aperture with a fourth order power law dependence. VSCEL sparing, water-cooling and redundancy though percentage of link failures are analyzed.
Keywords :
laser reliability; surface emitting lasers; VSCEL sparing; bit rate 250 Tbit/s; high productivity computers; laser reliability; link failures; vertical cavity surface emitting lasers; water-cooling; Apertures; Bandwidth; Bit rate; Degradation; Failure analysis; Power system reliability; Productivity; Redundancy; Surface emitting lasers; Vertical cavity surface emitting lasers;
Conference_Titel :
Information Photonics, 2005. IP 2005. OSA Topical Meeting on
Conference_Location :
Charlotte, NC
Print_ISBN :
978-1-4244-6637-5
