Title :
Method of persistent scatterer pairs (PSP) and high resolution SAR interferometry
Author :
Costantini, Mario ; Falco, Salvatore ; Malvarosa, Fabio ; Minati, Federico ; Trillo, Francesco
Author_Institution :
e-Geos S.p.A. / Telespazio S.p.A., Rome, Italy
Abstract :
Synthetic aperture radar (SAR) interferometry is an effective technology for detection and monitoring of slow terrain movements with millimetric resolution. This information is extracted by means of complex techniques from the phase of the signal, which is wrapped modulo 2¿ and affected by noise and systematic terms. We have recently proposed a new method, named persistent scatterer pairs (PSP), aimed at overcoming some limitations of standard persistent scatter interferometry (PSI) techniques. The method is characterized in that it works only with pairs of nearby pixels both for selecting and analyzing the persistent scatterers (PS), thus being intrinsically not affected by artifacts slowly variable in space, like those depending on atmosphere or orbits. Moreover, the method does not require an initial selection of PS based on the radar backscattered amplitude. In this work, after resuming the main ideas of the PSP method, we show some results obtained in extensive applications with ERS/ENVISAT data, and the first results obtained with high resolution COSMO-SkyMed images.
Keywords :
backscatter; geomorphology; geophysical signal processing; radar interferometry; synthetic aperture radar; COSMO-SkyMed images; ERS/ENVISAT data; high resolution SAR interferometry; millimetric resolution; persistent scatterer pairs; radar backscattered amplitude; signal phase; slow terrain movements; synthetic aperture radar; Atmosphere; Data mining; Interferometry; Monitoring; Orbits; Phase noise; Radar detection; Radar scattering; Signal resolution; Synthetic aperture radar; SAR; interferometry; persistent scatterer;
Conference_Titel :
Geoscience and Remote Sensing Symposium,2009 IEEE International,IGARSS 2009
Conference_Location :
Cape Town
Print_ISBN :
978-1-4244-3394-0
Electronic_ISBN :
978-1-4244-3395-7
DOI :
10.1109/IGARSS.2009.5417918