• DocumentCode
    513489
  • Title

    3D analysis of scattering effects based on Ray Tracing techniques

  • Author

    Auer, Stefan ; Zhu, Xiaoxiang ; Hinz, Stefan ; Bamler, Richard

  • Author_Institution
    Remote Sensing Technol., Tech. Univ. Munchen, Munich, Germany
  • Volume
    3
  • fYear
    2009
  • fDate
    12-17 July 2009
  • Abstract
    The side-looking geometry of SAR sensors hampers the interpretation of SAR images of urban areas. Simulation tools for illuminating 3D models of man-made objects by means of a virtual sensor support the interpretation of scattering effects by providing artificial images in the azimuth-range plane. In this paper, a simulation approach is presented which extends SAR simulation to three dimensions in order to focus detected intensity contributions in azimuth, range and elevation. Based on the simulation output, a concept for creating scatterer histograms displaying the number of scatterers within one resolution cell is introduced. Methods for analyzing simulated elevation data by means of selected slices are presented for an urban test site. Eventually, the number of scatterers extracted for a selected pixel by tomographic analysis, using a stack of spotlight TerraSAR-X images, is confirmed by results provided by the simulator.
  • Keywords
    geophysical techniques; ray tracing; remote sensing by radar; synthetic aperture radar; 3D SAR; 3D analysis; SAR sensors; SAR simulation; TerraSAR-X images; artificial images; azimuth-range plane; man-made objects; ray tracing techniques; scatterer histograms; scattering effects; tomographic analysis; urban areas; Analytical models; Azimuth; Data analysis; Focusing; Geometry; Histograms; Image sensors; Ray tracing; Scattering; Urban areas; 3D SAR; Ray Tracing; SAR Simulation; SAR Tomography; TerraSAR-X;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Geoscience and Remote Sensing Symposium,2009 IEEE International,IGARSS 2009
  • Conference_Location
    Cape Town
  • Print_ISBN
    978-1-4244-3394-0
  • Electronic_ISBN
    978-1-4244-3395-7
  • Type

    conf

  • DOI
    10.1109/IGARSS.2009.5418256
  • Filename
    5418256