• DocumentCode
    513590
  • Title

    Analysis of repeatability in conducted emission measurements

  • Author

    Kumar, L. Sathesh ; Yegneswari, R. ; Subbarao, B. ; Sivaramakrishnan, R.

  • Author_Institution
    Centre for Electromagn., SAMEER, Chennai, India
  • fYear
    2006
  • fDate
    23-24 Feb. 2006
  • Firstpage
    337
  • Lastpage
    341
  • Abstract
    International Civilian EMI/EMC standards define set-up to unify criteria. But it is difficult for one standard to cover every possibility that is applicable to different types of equipments. Inconsistencies are most often encountered and the repeatability problems are investigated, and reported for conducted emission measurement. SAMEER, as a EMC test laboratory has taken up such analysis to study the repeatability problems in conducted emission measurement. Laptop computer, a widely used SMPS based noisy source, was chosen as an Equipment Under Test (EUT). Various configurations of EUT were investigated and presented the results in this paper. Including these details in the test report can minimize the repeatability problems.
  • Keywords
    IEC standards; electric field measurement; electromagnetic compatibility; electromagnetic interference; SAMEER; conducted emission measurements; equipment under test; international civilian EMI-EMC standards; Electromagnetic compatibility; Electromagnetic interference; Electromagnetic measurements; Impedance; Information technology; Laboratories; Measurement standards; Portable computers; Switched-mode power supply; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    ElectroMagnetic Interference and Compatibility (INCEMIC), 2006 Proceedings of the 9th International Conference on
  • Conference_Location
    Bangalore
  • Print_ISBN
    978-1-4244-5203-3
  • Type

    conf

  • Filename
    5419727