• DocumentCode
    513591
  • Title

    Design of low cost common and differential mode noise diagnostic circuit

  • Author

    Ramesh, A.A. ; Subbarao, B. ; Sivaramakrishnan, R.

  • Author_Institution
    Centre for Electromagn., SAMEER, Chennai, India
  • fYear
    2006
  • fDate
    23-24 Feb. 2006
  • Firstpage
    343
  • Lastpage
    348
  • Abstract
    Conducted Emission measurement with LISN gives a combined emission of common mode and differential mode. All standards give the limits for this. By conducted emission, we mean the combined emission of common mode and differential mode on the power line from an Equipment Under Test (EUT). It is vital to be able to separate this common mode (CM) and differential mode (DM) noises in the conducted emission. For this we propose new discriminators which are low cost and easy to design. In the end, we also propose a relatively low cost approach using oscilloscope. The time domain measurement is performed and transformed into frequency domain using FFT. This can be easily designed, manufactured and used to measure conducted emission and analysed. The analysed test result of CM & DM emission is useful to design fixes to reduce emission as per required standard limits. The method of using oscilloscope is helpful for design engineers, as it saves money and time of testing with costly EMI receivers.
  • Keywords
    automatic testing; electromagnetic interference; fast Fourier transforms; power cables; EMI receivers; common mode noise; conducted emission measurement; differential mode noise diagnostic circuit; equipment under test; fast Fourier transforms; line impedance stabilization network; power line; time domain measurement; Circuit noise; Circuit testing; Costs; Delta modulation; Frequency domain analysis; Frequency measurement; Manufacturing; Oscilloscopes; Performance evaluation; Time measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    ElectroMagnetic Interference and Compatibility (INCEMIC), 2006 Proceedings of the 9th International Conference on
  • Conference_Location
    Bangalore
  • Print_ISBN
    978-1-4244-5203-3
  • Type

    conf

  • Filename
    5419728