• DocumentCode
    513676
  • Title

    A Capacitive Chemical Sensor based on Porous Silicon

  • Author

    Schöning, M.J. ; Crott, M. ; Ronkel, F. ; Thust, M. ; Schultze, J.W. ; Kordos, P. ; Lüth, H.

  • Author_Institution
    Institut fÿr Schicht-und Ionentechnik, Forschungszentrum Jÿlich GmbH, D-52425 Jÿlich, Germany
  • fYear
    1996
  • fDate
    9-11 Sept. 1996
  • Firstpage
    907
  • Lastpage
    910
  • Abstract
    A new capacitive field effect sensor based on a porous EIS (Electrolyte Insulator Semiconductor) structure is presented The porous silicon sensor was prepared using standard techniques of semiconductor processing Experimental conditions were adjusted to realize a well-defined macroporous formation of the silicon substrate. The porous sensor device made of Si/SiO2/Si3N4 exhibits a high, near-Nernstian pH sensitivity of about 54 mV per pH in the concentration range from pH 4 to pH 8, similar to a planar EIS structure with the same layer sequence. The enlargement of the active sensor area due to the porous layer structure increases the measured capacitance and thus allows a scaling down of the sensor.
  • Keywords
    Area measurement; Capacitance measurement; Capacitive sensors; Chemical sensors; Electrodes; Insulation; Scanning electron microscopy; Silicon; Substrates; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid State Device Research Conference, 1996. ESSDERC '96. Proceedings of the 26th European
  • Conference_Location
    Bologna, Italy
  • Print_ISBN
    286332196X
  • Type

    conf

  • Filename
    5435926