• DocumentCode
    513684
  • Title

    Array-Like Metal-Resistance-Semiconductor Photodetectors: Characterization and Modelling

  • Author

    Zappa, F. ; Lacaita, Andrea ; Catuozzo, M. ; Gotra, Y ; Malakhov, N. ; Sadygov, Z.

  • Author_Institution
    Politecnico di Milano, Dipartimento di Elettronica e Informazione, piazza L. da Vinci 32, 20133 Milano, Italy
  • fYear
    1996
  • fDate
    9-11 Sept. 1996
  • Firstpage
    895
  • Lastpage
    898
  • Abstract
    This paper reports the experimental characterisation of Metal-Resistance-Semiconductor devices. The effect of the confinement of the current around the seeding point is discussed and a complete device model is presented. The resistive layer improves the performance of the device and enables an array-like parallel detection of many photons. The advantages are: a reduced electronics complexity, no blind-zone, and uniform sensitivity.
  • Keywords
    Detectors; Negative feedback; Optical arrays; Photodetectors; Semiconductor device noise; Semiconductor device testing; Sensor arrays; Signal to noise ratio; Silicon; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid State Device Research Conference, 1996. ESSDERC '96. Proceedings of the 26th European
  • Conference_Location
    Bologna, Italy
  • Print_ISBN
    286332196X
  • Type

    conf

  • Filename
    5435935