Title :
Linear and Enhanced Transconductance using High-Medium-Low Doped Channel
Author :
Lour, Wen-Shiung ; Liu, Wen-Chau ; Tsai, Jung-Hui ; Laih, Lih-Wen
Author_Institution :
Department of Electrical Engineering, National Taiwan Ocean University, 2 Peining Rd., Keelung, TAIWAN, Republic of China.
Abstract :
We report linear, enhanced transconductance by high-medium-low doped-channel FET. A low-doped layer together with n+ and p+ layers establishes high-performance camel diode, which exhibits a high effective potential barrier of ≫ 1.0 V and a gate-drain breakdwon voltage of around 21 V (at Ig= 1.0 mA/mm). Whereas the transition and the thin, high-doped layers used to enhance transconductance and to improve device linearity. A 1.5Ã100 ¿m2 camel-diode gate FET (CAMFET) has a peak transconductance of 220 mS/mm and a current density of ≫ 800 mA/mm. On the other hand, the device has a transconductance of more than 80 percent of the peak value over a wide drain current range of 160 to 800 mA/mm. The improvement of device linearity and the enhancement of current density suggest that high-medium-low doped channel for a CAMFET is suitable for high power large signal circuit applications.
Keywords :
Breakdown voltage; Current density; Current measurement; Diodes; FETs; Linearity; MESFET circuits; Oceans; Thickness measurement; Transconductance;
Conference_Titel :
Solid State Device Research Conference, 1995. ESSDERC '95. Proceedings of the 25th European
Conference_Location :
The Hague, The Netherlands