• DocumentCode
    513804
  • Title

    All-Injection Modeling of Collector Current and Transit Time in SiGe Bipolar Transistors

  • Author

    Rinaldi, N.F.

  • Author_Institution
    Department of Electronic Engineering of the University of Naples, via Claudio, 21 - 80125 - Naples, Italy
  • fYear
    1995
  • fDate
    25-27 Sept. 1995
  • Firstpage
    785
  • Lastpage
    788
  • Abstract
    An analytical investigation of the minority-carrier transport properties at arbitrary injection levels is presented. Firstly, it is shown that the minority-carrier transport equation is exactly soluble at high-injection levels, yielding closed-form expressions for the injected current, transit time and sheet resistance. Then, a simple analytical model valid at arbitrary injection levels is proposed. The analysis retains a general dependence of the transport parameters on composition and doping concentration, and is thus applicable to SiGe HBTs.
  • Keywords
    Analytical models; Bipolar transistors; Closed-form solution; Current density; Doping profiles; Electrons; Equations; Germanium silicon alloys; Semiconductor process modeling; Silicon germanium;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid State Device Research Conference, 1995. ESSDERC '95. Proceedings of the 25th European
  • Conference_Location
    The Hague, The Netherlands
  • Print_ISBN
    286332182X
  • Type

    conf

  • Filename
    5436131