• DocumentCode
    514005
  • Title

    A Salicide Base Contact Technology (SCOT) for Use in High Speed Bipolar VLSI

  • Author

    Hirao, Tadashi ; Ikeda, Tatsuhiko ; Kuramisu, Yoichi

  • Author_Institution
    LSI Research and Development Laboratory, Mitsubishi Electric Corporation, 4-1 Mizuhara, Itami, P.O.Box. 664, Japan.
  • fYear
    1987
  • fDate
    14-17 Sept. 1987
  • Firstpage
    373
  • Lastpage
    376
  • Abstract
    This paper describes a new process technology, which is called SCOT: salicide (self-aligned silicide) base contact technology, and applied for realizing high performance prescaler IC and high gate density masterslice LSI. The main feature of this process, for reduction of the base resistance and capacitance, is a silicidation of the base contact which is opened by employing self-alignment technology. A 1/128, 1/129 two-modulus prescaler IC constructed of the 1.5 ¿m SCOT transistors has been improved to a high operation of 2.1 GHz at 56-mW power dissipation. An ECL 18K-gate masterslice has been developed by a variable size cell (VSC) approach, employing the SCOT process.
  • Keywords
    Automotive electronics; Capacitance; Etching; Frequency; Large scale integration; Power dissipation; Resistors; Silicidation; Silicides; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid State Device Research Conference, 1987. ESSDERC '87. 17th European
  • Conference_Location
    Bologna, Italy
  • Print_ISBN
    0444704779
  • Type

    conf

  • Filename
    5436622