DocumentCode
514059
Title
Gettering of Metal Precipitates
Author
Bronner, Gary ; Plummer, James
Author_Institution
IBM TJ Watson Research Center, PO Box 218, Yorktown Heights, NY 10598
fYear
1987
fDate
14-17 Sept. 1987
Firstpage
557
Lastpage
560
Abstract
In this paper we deal with the effect of silicon interstitials on metal precipitates. We show that excess silicon interstitials which are injected by common gettering treatments cause most metal precipitates to shrink but a few to grow. Data from the literature confirms that the precipitates which grow by the absorption of silicon interstitials (primarily FeSi2 and NiSi2 ) are found exclusively in regions that act as net injectors of silicon interstitials. Other precipitates shrink in the presence of excess silicon interstitials and are easily gettered. This explains why silicon interstitial injection is essential for effective gettering.
Keywords
Absorption; Argon; Copper; Electric breakdown; Gettering; Gold; Iron; Nickel; Silicon; Temperature;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid State Device Research Conference, 1987. ESSDERC '87. 17th European
Conference_Location
Bologna, Italy
Print_ISBN
0444704779
Type
conf
Filename
5436693
Link To Document