• DocumentCode
    514059
  • Title

    Gettering of Metal Precipitates

  • Author

    Bronner, Gary ; Plummer, James

  • Author_Institution
    IBM TJ Watson Research Center, PO Box 218, Yorktown Heights, NY 10598
  • fYear
    1987
  • fDate
    14-17 Sept. 1987
  • Firstpage
    557
  • Lastpage
    560
  • Abstract
    In this paper we deal with the effect of silicon interstitials on metal precipitates. We show that excess silicon interstitials which are injected by common gettering treatments cause most metal precipitates to shrink but a few to grow. Data from the literature confirms that the precipitates which grow by the absorption of silicon interstitials (primarily FeSi2 and NiSi2) are found exclusively in regions that act as net injectors of silicon interstitials. Other precipitates shrink in the presence of excess silicon interstitials and are easily gettered. This explains why silicon interstitial injection is essential for effective gettering.
  • Keywords
    Absorption; Argon; Copper; Electric breakdown; Gettering; Gold; Iron; Nickel; Silicon; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid State Device Research Conference, 1987. ESSDERC '87. 17th European
  • Conference_Location
    Bologna, Italy
  • Print_ISBN
    0444704779
  • Type

    conf

  • Filename
    5436693