• DocumentCode
    514082
  • Title

    The Effect of the Proximity of the Bird´s Beak on Aging of the Thin Oxide by High Field Current Stress

  • Author

    Marchetaux, J.-C. ; Doyle, B. ; Boudou, A.

  • Author_Institution
    BULL S.A., Ave Jean-Jaures, 78340 Les Clayes sous Bois, FRANCE.
  • fYear
    1987
  • fDate
    14-17 Sept. 1987
  • Firstpage
    713
  • Lastpage
    716
  • Keywords
    Aging; Capacitance-voltage characteristics; Capacitors; Circuits; Electrons; Fabrication; Interface states; Stress; Very large scale integration; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid State Device Research Conference, 1987. ESSDERC '87. 17th European
  • Conference_Location
    Bologna, Italy
  • Print_ISBN
    0444704779
  • Type

    conf

  • Filename
    5436728