The Measurement of Transistor Characteristics Using On-chip Switching for the Connection of Instrumentation

This paper investigates the feasibility of using on-chip switching for the instrumentation used to measure transistor characteristics. The effect of the switching transistors on the measurements are evaluated by comparing the SPICE parameters extracted from measurements made via the switching transistors with those derived directly. It is shown lthat accurate SPICE parameters can be extracted from process control chips with on-chip switching.