• DocumentCode
    51436
  • Title

    Physics of the Negative Resistance in the Avalanche I{-}V Curve of Field Stop IGBTs: Collector Design Rules for Improved Ruggedness

  • Author

    Spirito, Paolo ; Breglio, Giovanni ; Irace, Andrea ; Maresca, Luca ; Napoli, Ettore ; Riccio, Michele

  • Author_Institution
    Dept. of Electr. & Inf. Technol. Eng., Univ. of Naples Federico II, Naples, Italy
  • Volume
    61
  • Issue
    5
  • fYear
    2014
  • fDate
    May-14
  • Firstpage
    1457
  • Lastpage
    1463
  • Abstract
    In this paper, we investigate the avalanche behavior of field-stop insulated gate bipolar transistors (IGBTs) by means of analytical and theoretical considerations, supported by ad hoc numerical simulations. A physical explanation of the presence of negative differential resistance branches in the avalanche I-V curve of the IGBT is presented and design criteria are derived to reduce and eventually eliminate this effect.
  • Keywords
    insulated gate bipolar transistors; negative resistance; IGBT; ad hoc numerical simulations; avalanche I-V curve; avalanche behavior; design criteria; field-stop insulated gate bipolar transistors; negative differential resistance branches; Current density; Doping; Insulated gate bipolar transistors; Integrated circuits; Mobile communication; Resistance; Transistors; Avalanche ruggedness; current filamentation; insulated gate bipolar transistor (IGBT) design; insulated gate bipolar transistor (IGBT) design.;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2014.2311169
  • Filename
    6778060