• DocumentCode
    514956
  • Title

    Predication of Sediment Yield Using Wavelet-Neural Networks

  • Author

    Yao, Chuan-an ; Yu, Yong-chang

  • Author_Institution
    Coll. of Mech. & Electr. Eng., Henan Agric. Univ., Zhengzhou, China
  • Volume
    2
  • fYear
    2010
  • fDate
    13-14 March 2010
  • Firstpage
    911
  • Lastpage
    914
  • Abstract
    Accurate prediction of watershed sediment yield is important for ecological environment and water resources engineering. Based on the advantages of wavelet analysis and neural networks, a new hybrid model of wavelet transform and BP neural network (wavelet-neural network model, WANN) for predicting the sediment yield, has been suggested in this paper. The established WANN model is applied to make quantitative prediction of annual sediment yield for Hepinggou´s small watershed, located in the southwest of China´s Henan Province. First, the annual sediment yield time series is decomposed and reconstructed into the low-frequency component and the high-frequency components at one-scale level by db2 wavelet, and then both are forecasted respectively with BP neural networks. Finally, the sum of two parts is the predicting result of the annual sediment yield. Results show that the suggested model can improve the forecasting accuracy; it can also be successfully applied to prediction of hydrological time series.
  • Keywords
    backpropagation; neural nets; time series; water resources; wavelet transforms; BP neural network; WANN; backpropagation; ecological environment; hydrological time series; sediment yield prediction; water resources engineering; watershed sediment yield; wavelet neural network; wavelet transform; Biological system modeling; Floods; Geologic measurements; Neural networks; Predictive models; Rivers; Sediments; Soil measurements; Vegetation; Wavelet analysis; BP Neural Networks; Prediction; Sediment Yield; Wavelet Transform;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Measuring Technology and Mechatronics Automation (ICMTMA), 2010 International Conference on
  • Conference_Location
    Changsha City
  • Print_ISBN
    978-1-4244-5001-5
  • Electronic_ISBN
    978-1-4244-5739-7
  • Type

    conf

  • DOI
    10.1109/ICMTMA.2010.794
  • Filename
    5459971