DocumentCode :
515047
Title :
Research of Noise Suppression for CMOS Image Sensor
Author :
Luo, Bin ; Yan, Lei ; Yang, Fuxing
Author_Institution :
Beijing Univ. of Posts & Telecommun., Beijing, China
Volume :
2
fYear :
2010
fDate :
13-14 March 2010
Firstpage :
1100
Lastpage :
1103
Abstract :
Noise problem has a strong impact on the performance of sensor, especially in the field of aviation remote sensing. In this paper, the structure difference of CMOS and CCD image sensor is analyzed, and the noise affection and reasons are researched for CMOS image quality. Then the effective methods for each type of noise suppression are presented to improve the imaging capability. These researches provide theoretical support for the development of CMOS image sensor technology, and give a chance to use in the field of aviation remote sensing.
Keywords :
CCD image sensors; CMOS image sensors; remote sensing; CCD image sensor; CMOS image sensor; aviation remote sensing; imaging capability; noise affection; noise suppression; CMOS image sensors; CMOS technology; Charge coupled devices; Charge-coupled image sensors; Circuits; Computational Intelligence Society; High-resolution imaging; Noise reduction; Remote sensing; Semiconductor device noise; CMOS Image Sensor(CIS); Fixed Pattern Noise(FPN); Random Noise; Suppression;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Measuring Technology and Mechatronics Automation (ICMTMA), 2010 International Conference on
Conference_Location :
Changsha City
Print_ISBN :
978-1-4244-5001-5
Electronic_ISBN :
978-1-4244-5739-7
Type :
conf
DOI :
10.1109/ICMTMA.2010.261
Filename :
5460209
Link To Document :
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