Title :
Estimation of a normal process variance from measurements with large round-off errors
Author :
Diamanta, Benson-Karhi ; Ellite, Dvir-Harcabi ; Itai, Regev ; Edna, Schechtman
Author_Institution :
Dept. of Math. & Comput. Sci., Open Univ. of Israel, Raanana, Israel
Abstract :
Measurements are sometimes affected by excessively large round-off errors. Small rounding-off may safely be ignored for purposes of statistical inference however large rounding-off may have an effect. The importance of the round-off (δ) is determined by the ratio between the standard deviation σ and the instrument´s scale step h, δ = σ/h. In this study, the authors estimate σ when δ is small (δ <; 0.5) using a variant of the method of moments (MoM). The MoM estimators are compared with the maximum-likelihood estimators (MLE), using simulation. The authors find that the MoM can improve the estimation in terms of mean-square error and bias, especially under circumstances where the MLE method is not accurate or cannot provide a solution.
Keywords :
mean square error methods; measurement errors; method of moments; statistical analysis; MoM; bias estimation; instrument scale; mean square error estimation; method of moments; normal process variance estimation; round-off error; standard deviation; statistical inference;
Journal_Title :
Science, Measurement & Technology, IET
DOI :
10.1049/iet-smt.2012.0031