DocumentCode
515981
Title
High power reliability for plug style optical attenuators
Author
Shibuya, Takashi ; Nagase, Ryo ; Takahashi, Toru ; Kubo, Daisuke ; Matsuura, Hiroshi
Author_Institution
NEC Corp., Abiko, Japan
fYear
2010
fDate
21-25 March 2010
Firstpage
1
Lastpage
3
Abstract
High power damage threshold test and thermal simulation for plug-style optical attenuator were carried out. The degradation mode and its mechanism were clarified. The limit in high power level for assuring long-term reliability was confirmed.
Keywords
optical attenuators; optical fibre networks; high power damage threshold test; high power reliability; plug style optical attenuators; thermal simulation; Optical attenuators; Optical devices; Optical fiber devices; Optical fiber testing; Optical losses; Plugs; Power measurement; Power system reliability; Stimulated emission; Temperature measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Optical Fiber Communication (OFC), collocated National Fiber Optic Engineers Conference, 2010 Conference on (OFC/NFOEC)
Conference_Location
San Diego, CA
Electronic_ISBN
978-1-55752-884-1
Type
conf
Filename
5465694
Link To Document