Test Strategy For The Signal Processor KISS16

As the level of VLSI chip complexity increases to several hundred thousands transistors, aspects of test and design for testability become more important. Build-In Self Test (BIST) methods are increasingly applied on chip to raise the fault coverage, to minimize the purchase of expensive test equipment and at the end guarantee high quality parts for application. This paper presents the test strategy for the 16 bit digital signal processor KISS16. Major effort has been spent on the development of an open modular test concept, which uses functional BIST and scan test for structural testing.