• DocumentCode
    516186
  • Title

    A 16 Kbits E2PROM Testvehicle for ASIC Technologies

  • Author

    Dijkstra, E. ; Sen-Gupta, S. ; Li, S. ; Moret, J.M.

  • Author_Institution
    CSEM, Neuchatel, Switzerland
  • Volume
    1
  • fYear
    1990
  • fDate
    19-21 Sept. 1990
  • Firstpage
    145
  • Lastpage
    148
  • Abstract
    This paper discusses the basic philosophy, the technology and the most critical circuits for the design of a 16k double poly E2PR0M testvehicle for ASIC technologies. All developments are valid for three generations of technologies (2μm, 1.6μm and 1.2μm).
  • Keywords
    EPROM; application specific integrated circuits; integrated circuit design; integrated circuit testing; ASIC technologies; double-poly E2PR0M testvehicle design; size 1.2 mum; size 1.6 mum; size 2 mum; Application specific integrated circuits; CMOS technology; Capacitors; Charge transfer; Clocks; Computer architecture; Energy consumption; Sampling methods; Signal restoration; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Circuits Conference, 1990. ESSCIRC '90. Sixteenth European
  • Conference_Location
    Grenoble
  • Print_ISBN
    2-86332-087-4
  • Type

    conf

  • Filename
    5467767
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=516186