DocumentCode
516195
Title
Block-Oriented Test-Strategy for Analog Circuits
Author
Schäfer, G. ; Sapotta, H. ; Denner, W.
Author_Institution
TELEFUNKEN electronic GmbH D-7100 Heilbronn
Volume
1
fYear
1991
fDate
11-13 Sept. 1991
Firstpage
217
Lastpage
220
Keywords
Analog circuits; CMOS logic circuits; CMOS technology; Circuit testing; Digital circuits; Electronic equipment testing; Energy consumption; Frequency; Integrated circuit technology; Logic testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State Circuits Conference, 1991. ESSCIRC '91. Proceedings - Seventeenth European
Conference_Location
Milan, Italy
Type
conf
Filename
5467776
Link To Document