DocumentCode
516212
Title
A New Trim Technique for Monolithic D/A Converters
Author
Bowers, Derek F.
Author_Institution
Precision Monolithics Inc. Santa Clara, California U. S. A.
fYear
1984
fDate
0-0 Sept. 1984
Firstpage
268
Lastpage
271
Abstract
A new post-assembly bipolar analogue trim technique is described which requires no extra process steps or special test equipment The technique has been applied to produce a monolithic 12 bit D/A converter with better than 0.006% linearity.
Keywords
Circuit testing; Costs; Fabrication; Laser beam cutting; Linearity; PROM; Packaging; Pins; Resistors; Transistors;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State Circuits Conference, 1984. ESSCIRC '84. Tenth European
Conference_Location
Edinburgh, UK
Type
conf
Filename
5467795
Link To Document