DocumentCode
516502
Title
ECIPS/DAQ: A Transistor Modelling Environment
Author
Drazin, Jonathan P.V. ; Barnard, Andrew M.
Author_Institution
STC Technology Limited, Harlow, England
fYear
1988
fDate
21-23 Sept. 1988
Firstpage
309
Lastpage
312
Abstract
A general purpose transistor measurement and characterisation system for the development of compact device models is described. The environment comprises a measurement (DAQ) and a parameter extraction (ECIPS) system used in conjunction with a commercial relational database management system (RDBMS).
Keywords
Circuit simulation; Data acquisition; Environmental management; Instruments; Optimization methods; Parameter extraction; Productivity; Relational databases; Scattering; Writing;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State Circuits Conference, 1988. ESSCIRC '88. Fourteenth European
Conference_Location
Manchester, UK
Type
conf
Filename
5468287
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